Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, and data analysis in the use of X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis for surface chemical and structural analysis.
* number includes updates
|15||October 2019||つくば市 (Japan)||ISO/TC 201/SC 10|
|31-2||October-November 2019||Tsukuba (Japan)||ISO/TC 201|
* Information definite but meeting not yet formally convened