About
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Secretariat: SAC
Committee Manager: -
Chairperson (until end 2024):Mr Jiang Zhao
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ISO Technical Programme Manager [TPM]:ISO Editorial Manager [EM]:
- Creation date: 1991
Scope
Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal.
Note:
The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.
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This committee contributes with 4 standards to the following Sustainable Development Goal:
| Reference | Title | Type |
|---|---|---|
| ISO/TC 202/SC 1 | Terminology | Subcommittee |
| ISO/TC 202/SC 2 | Electron probe microanalysis | Subcommittee |
| ISO/TC 202/SC 3 | Analytical electron microscopy | Subcommittee |
| ISO/TC 202/SC 4 | Scanning electron microscopy | Subcommittee |
| ISO/TC 202/AG | Future Directions in Microbeam Analysis | Working group |
| ISO/TC 202/WG 1 | General procedures and data management | Working group |
| ISO/TC 202/WG 6 | Microbeam analysis - Guideline for electron backscatter diffraction analysis | Working group |
Liaison Committees to ISO/TC 202
The committees below can access the documents of ISO/TC 202:
| Reference | Title | ISO/IEC |
|---|---|---|
| ISO/TC 201 | Surface chemical analysis | ISO |
| ISO/TC 201/SC 10 | X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
Liaison Committees from ISO/TC 202
ISO/TC 202 can access the documents of the committees below:
| Reference | Title | ISO/IEC |
|---|---|---|
| ISO/TC 201 | Surface chemical analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
ISO/TC 202 - Secretariat
Tel: +86 10 82 61 84 76
Fax: +86 10 82 61 84 76