ISO/TC 202

About

Secretariat: SAC

Secretary:

Mr Ning Zhao
Chairperson (until end 2021):

Mr Jiang Zhao
ISO Technical Programme Manager :

M Stéphane Sauvage

ISO Editorial Programme Manager :

Ms Jasmin Lewis
Creation date: 1991

Scope

Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal.

Note:

The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.

Quick links

Work programme

Drafts and new work items
Business plans

TC Business plans for public review
Working area

on ISOTC and Public information folder
ISO Electronic applications

IT Tools that help support the standards development process

This committee contributes with 1 standard to the following Sustainable Development Goal:

Industry, Innovation and Infrastructure

published ISO standards *

related to the TC and its SCs

of which 6 under the direct responsibility of ISO/TC 202

ISO standards under development *

related to the TC and its SCs

of which 5 under the direct responsibility of ISO/TC 202

Participating members

Observing members

* number includes updates

Reference	Title	Type
ISO/TC 202/SC 1	Terminology	Sub committee
ISO/TC 202/SC 2	Electron probe microanalysis	Sub committee
ISO/TC 202/SC 3	Analytical electron microscopy	Sub committee
ISO/TC 202/SC 4	Scanning electron microscopy (SEM)	Sub committee
ISO/TC 202/WG 1	General procedures and data management	Working group
ISO/TC 202/WG 4	Energy dispersive X-ray spectroscopy	Working group
ISO/TC 202/WG 7	Microbeam analysis - Electron Backscatter Diffraction - Measurement of average grain size	Working group
ISO/TC 202/WG 9	Guideline for mis‐orientation analysis to assess mechanical damage by EBSD	Working group

Liaison Committees to ISO/TC 202

The committees below can access the documents of ISO/TC 202:

Reference	Title	ISO/IEC
ISO/TC 201	Surface chemical analysis	ISO
ISO/TC 201/SC 10	X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis	ISO
ISO/TC 229	Nanotechnologies	ISO

Liaison Committees from ISO/TC 202

ISO/TC 202 can access the documents of the committees below:

Reference	Title	ISO/IEC
ISO/TC 201	Surface chemical analysis	ISO
ISO/TC 229	Nanotechnologies	ISO

Organizations in liaison (Category A and B)

Acronym	Title	Category
EMAS	European Microbeam Analysis Society	A

Date	Month	Location	TC/SC	Note
23-25	October 2019	Hangzhou (China)	ISO/TC 202

* Information definite but meeting not yet formally convened
** Provisional

ISO/TC 202 - Secretariat

SAC China

Institute of Chemistry

Bei Yi Jie 2#, ZhongGuanCun
Beijing 100190
China

Tel: +86 10 82 61 84 76

Fax: +86 10 82 61 84 76

Secretariat direct:

Mr Ning Zhao

Email: zhaoning@iccas.ac.cn

Microbeam analysis