About

Scope

Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal.

Note:

The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.

Quick links

Sustainable Development Goals

This committee contributes with 1 standard to the following Sustainable Development Goal:

9
Industry, Innovation and Infrastructure
23

published ISO standards *

related to the TC and its SCs

of which 6 under the direct responsibility of ISO/TC 202

11

ISO standards under development *

related to the TC and its SCs

of which 5 under the direct responsibility of ISO/TC 202

9

Participating members

14

Observing members

* number includes updates

Reference Title Type
ISO/TC 202/SC 1 Terminology Sub committee
ISO/TC 202/SC 2 Electron probe microanalysis Sub committee
ISO/TC 202/SC 3 Analytical electron microscopy Sub committee
ISO/TC 202/SC 4 Scanning electron microscopy (SEM) Sub committee
ISO/TC 202/AG Future Directions in Microbeam Analysis Working group
ISO/TC 202/WG 1 General procedures and data management Working group
ISO/TC 202/WG 4 Energy dispersive X-ray spectroscopy Working group
ISO/TC 202/WG 7 Microbeam analysis - Electron Backscatter Diffraction - Measurement of average grain size Working group
ISO/TC 202/WG 9 Guideline for mis‐orientation analysis to assess mechanical damage by EBSD Working group
ISO/TC 202/WG 10 Microbeam analysis - Electron backscatter diffraction of steel products Working group

Liaison Committees to ISO/TC 202

The committees below can access the documents of ISO/TC 202:

Reference Title ISO/IEC
ISO/TC 201 Surface chemical analysis ISO
ISO/TC 201/SC 10 X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis ISO
ISO/TC 229 Nanotechnologies ISO

 

Liaison Committees from ISO/TC 202

ISO/TC 202 can access the documents of the committees below:

Reference Title ISO/IEC
ISO/TC 201 Surface chemical analysis ISO
ISO/TC 229 Nanotechnologies ISO

 

Organizations in liaison (Category A and B)

Acronym Title Category
EMAS European Microbeam Analysis Society A

ISO/TC 202 - Secretariat

SAC [China]

Institute of Chemistry
Bei Yi Jie 2#, ZhongGuanCun
Beijing 100190
China

Tel: +86 10 82 61 84 76
Fax: +86 10 82 61 84 76

Secretariat direct:

Mr Ning Zhao