About
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Secretariat: SAC
Committee Manager: -
Chairperson (until end 2021):Mr Jiang Zhao
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ISO Technical Programme Manager [TPM]:ISO Editorial Programme Manager [EPM]:
- Creation date: 1991
Scope
Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal.
Note:
The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.
Quick links
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Work programme
Drafts and new work items -
Business plans
TC Business plans for public review -
Working area
on ISOTC and Public information folder -
ISO Electronic applications
IT Tools that help support the standards development process
This committee contributes with 1 standard to the following Sustainable Development Goal:
| Reference | Title | Type |
|---|---|---|
| ISO/TC 202/SC 1 | Terminology | Sub committee |
| ISO/TC 202/SC 2 | Electron probe microanalysis | Sub committee |
| ISO/TC 202/SC 3 | Analytical electron microscopy | Sub committee |
| ISO/TC 202/SC 4 | Scanning electron microscopy (SEM) | Sub committee |
| ISO/TC 202/AG | Future Directions in Microbeam Analysis | Working group |
| ISO/TC 202/WG 1 | General procedures and data management | Working group |
| ISO/TC 202/WG 4 | Energy dispersive X-ray spectroscopy | Working group |
| ISO/TC 202/WG 7 | Microbeam analysis - Electron Backscatter Diffraction - Measurement of average grain size | Working group |
| ISO/TC 202/WG 9 | Guideline for mis‐orientation analysis to assess mechanical damage by EBSD | Working group |
| ISO/TC 202/WG 10 | Microbeam analysis - Electron backscatter diffraction of steel products | Working group |
Liaison Committees to ISO/TC 202
The committees below can access the documents of ISO/TC 202:
| Reference | Title | ISO/IEC |
|---|---|---|
| ISO/TC 201 | Surface chemical analysis | ISO |
| ISO/TC 201/SC 10 | X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
Liaison Committees from ISO/TC 202
ISO/TC 202 can access the documents of the committees below:
| Reference | Title | ISO/IEC |
|---|---|---|
| ISO/TC 201 | Surface chemical analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
ISO/TC 202 - Secretariat
Tel: +86 10 82 61 84 76
Fax: +86 10 82 61 84 76