International Standard
ISO 23131-3:2026
Ellipsometry — Part 3: Transparent single layer model
Reference number
ISO 23131-3:2026
Edition 1
2026-01
Read sample
ISO 23131-3:2026
83903
Published (Edition 1, 2026)

ISO 23131-3:2026

ISO 23131-3:2026
83903
Language
Format
CHF 159

Abstract

This document uses ellipsometric measurements and their analysis to specify the method for the determination of the layer thickness d of a transparent layer and the optical (refractive index n) or dielectric (real part ε1) constants/functions based on the transparent single layer model within a spectral region, for which k = 0 applies.

General information

  •  : Published
     : 2026-01
    : International Standard published [60.60]
  •  : 1
     : 29
  • ISO/TC 107
    17.020 
  • RSS updates

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