Projet de comité
ISO/CD TS 23879
Nanotechnologies — Structural characterization of graphene oxide flakes — Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy
Numéro de référence
ISO/CD TS 23879
ISO/CD TS 23879
Edition 1
© ISO 2026
Projet de comité
Résumé
This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
Informations générales
-
État actuel: ProjetStade: CD approuvé pour enregistrement comme DIS [30.99]
-
Edition: 1
-
Comité technique :ISO/TC 229
- RSS mises à jour
