Committee Draft
ISO/CD TS 23879
Nanotechnologies — Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM
Reference number
ISO/CD TS 23879
Edition 1
© ISO 2026
Committee Draft
Under development
A draft is being reviewed by the committee.

Abstract

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

General information

  • Status
     : Under development
    Stage
    : CD approved for registration as DIS [30.99]
  • Edition
     : 1
  • Technical Committee :
    ISO/TC 229
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

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