Borrador del Comité
ISO/CD TS 23879
Nanotechnologies — Structural characterization of graphene oxide flakes — Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy
Reference number
ISO/CD TS 23879
ISO/CD TS 23879
Edition 1
© ISO 2026
Borrador del Comité
Resumen
This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
Informaciones generales
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Estado: En desarrolloEtapa: CD aprobado para su registro como DIS [30.99]
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Edición: 1
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Comité Técnico :ISO/TC 229
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