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Стандарт и/или проект находящийся в компетенции ISO/TC 201/SC 9 Секретариата Этап ICS
ISO 11039:2012
Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
90.60
ISO 11775:2015
Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
60.60
ISO 11952 [Under development]
Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
60.00
ISO 11952:2014
Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
90.92
ISO 13083:2015
Surface chemical analysis -- Scanning probe microscopy -- Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
60.60
ISO 13095:2014
Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
60.60
ISO/CD TR 13096 [Under development]
Surface chemical analysis -- Scanning-probe microscopy -- Guidelines for the description of AFM probe properties
30.00
ISO/DIS 21222 [Under development]
Surface chemical analysis -- Scanning probe microscopy -- Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
40.20
ISO/NP 23683 [Under development]
Surface chemical analysis -- scanning probe microscopy -- Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
10.99
ISO 27911:2011
Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
90.93

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