Résumé
This document specifies procedures for the rating and statistical analysis of non-metallic inclusions (referred to as inclusions hereafter) using a scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDS), a backscattered detector (BSD) and automatic image analysis capabilities.
Informations générales
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État actuel: PubliéeDate de publication: 2025-09Stade: Norme internationale publiée [60.60]
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Edition: 1
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Comité technique :ISO/TC 17/SC 7ICS :77.080.20
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