Resumen
This document specifies procedures for the rating and statistical analysis of non-metallic inclusions (referred to as inclusions hereafter) using a scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDS), a backscattered detector (BSD) and automatic image analysis capabilities.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2025-09Etapa: Norma Internacional publicada [60.60]
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Edición: 1Número de páginas: 19
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Comité Técnico :ISO/TC 17/SC 7ICS :77.080.20
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