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ISO 17862:2014 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. ISO 17862:2014 can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.
Informations générales
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État actuel : PubliéeDate de publication : 2013-12
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Edition : 1
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- ICS :
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Méthodes d'analyse chimique
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Cycle de vie
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Actuellement
PubliéeISO 17862:2013
Les normes ISO sont réexaminées tous les cinq ans
Stade: 90.92 (Sera révisée) -
Sera remplacée par
ProjetISO/DIS 17862
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