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ISO 17862:2014 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. ISO 17862:2014 can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.
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Текущий статус : PublishedДата публикации : 2013-12
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Версия : 1
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- ICS :
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Chemical analysis
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PublishedISO 17862:2013
Стандарт, который пересматривается каждые 5 лет
Этап: 90.92 (Будет пересмотрено) -
Будет заменено
Under developmentISO/DIS 17862
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