Approved Work Item
ISO/AWI 26665
Microbeam analysis--Preparation of sectional specimens for metallic materials using focused ion beam
Reference number
ISO/AWI 26665
Edition 1
© ISO 2026
Approved Work Item
Under development
A working group has prepared a draft.

Abstract

This document specifies the equipment, sample pretreatment, preparation conditions, and procedures of preparing sectional specimens by using focused ion beam (FIB) technique. This document applies to the preparation of sectional specimens of metal materials, including substrates, surface coatings, and corrosion layers. Other materials may refer to this document for guidance.

General information

  • Status
     : Under development
    Stage
    : New project registered in TC/SC work programme [20.00]
  • Edition
     : 1
  • Technical Committee :
    ISO/TC 202
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

Got a question?

Check out our Help and Support

  2. Store
  3. Store
  4. ICS
  5. ISO/AWI 26665