ISO/AWI 24904

Projet

Un groupe de travail a préparé un projet.

Résumé

This document specifies procedures for the measurement of optical distortion for microscopy optical imaging. These measurements are defined in image planes or intermediate image planes only, when these planes are suitable for detection by electronic imaging devices. This document also specifies the information that is to be provided to the users. This document does not apply to confocal microscopes employing a scanner device for laser scanning.

Informations générales

État actuel
: Projet

Stade
: Nouveau projet enregistré au programme de travail du TC/SC [20.00]
Edition
: 1
Comité technique :
ISO/TC 172/SC 5
RSS mises à jour