Résumé
PreviewISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.
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État actuel: PubliéeDate de publication: 2017-11
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Edition: 1
Acheter cette norme
| Format | Langue | |
|---|---|---|
| std 1 166 | PDF + ePub | |
| std 2 166 | Papier |
- CHF166
Cycle de vie
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Actuellement
PubliéeISO 20263:2017
Les normes ISO sont réexaminées tous les cinq ans
Stade: 90.60 (En cours d'examen)
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