Résumé

ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)


Informations générales 

  • État actuel
     : Annulée
    Date de publication
     : 2010-06
  • Edition
     : 1
  • Comité technique
     : ISO/TC 202/SC 3 Microscopie analytique à électrons
  • ICS
     :
    37.020 Matériel optique

Cycle de vie

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