Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal.
Note:
The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.
| Ссылки | Заголовок | Тип |
|---|---|---|
| ISO/TC 202/SC 1 | Terminology | Sub committee |
| ISO/TC 202/SC 2 | Electron probe microanalysis | Sub committee |
| ISO/TC 202/SC 3 | Analytical electron microscopy | Sub committee |
| ISO/TC 202/SC 4 | Scanning electron microscopy (SEM) | Sub committee |
| ISO/TC 202/WG 1 | General procedures and data management | Working group |
| ISO/TC 202/WG 4 | Energy dispersive X-ray spectroscopy | Working group |
| ISO/TC 202/WG 7 | Microbeam analysis - Electron Backscatter Diffraction - Measurement of average grain size | Working group |
| ISO/TC 202/WG 9 | Guideline for mis‐orientation analysis to assess mechanical damage by EBSD | Working group |
Комитет, указанный ниже, имеет доступ к следующим документам ISO/TC 202:
| Ссылка | Заголовок | ИСО/МЭК |
|---|---|---|
| ISO/TC 201 | Surface chemical analysis | ISO |
| ISO/TC 201/SC 10 | X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
ISO/TC 202 можно получить доступ к документам комитетов ниже
| Ссылка | Заголовок | ИСО/МЭК |
|---|---|---|
| ISO/TC 201 | Surface chemical analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
| Акроним | Заголовок | Тип рабочей связи |
|---|---|---|
| EMAS | European Microbeam Analysis Society | A |
| Дата | Меяц | Местоположение | ТК/ПК | Примечание |
|---|---|---|---|---|
| 23-25 | October 2019 | Hangzhou (China) | ISO/TC 202 |
* Информация определена, но заседание еще официально не проведено
** Предварительное