Standards catalogue

ISO/TC 201/SC 2

General procedures

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Standard and/or project under the direct responsibility of ISO/TC 201/SC 2 Secretariat Stage ICS
ISO 16242:2011
Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
90.93
ISO 16243:2011
Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
90.93
ISO/TR 16268:2009
Surface chemical analysis -- Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
60.60
ISO 18116:2005
Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis
90.92
ISO 18117:2009
Surface chemical analysis -- Handling of specimens prior to analysis
90.92
ISO 18516:2006
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
90.92
ISO/DIS 18516 [Under development]
Surface chemical analysis -- Determination of lateral resolution and sharpness in beam based methods
40.99
ISO/TR 19319:2003 [Withdrawn]
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution, analysis area, and sample area viewed by the analyser
95.99
ISO/TR 19319:2013
Surface chemical analysis -- Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
60.60
ISO/DIS 20579-1 [Under development]
Surface chemical analysis -- Guidelines to sample handling, preparation and mounting -- Part 1: Guidelines to handling of specimens prior to analysis
40.60
ISO/DIS 20579-2 [Under development]
Surface chemical analysis -- Guidelines to sample handling, preparation and mounting -- Part 2: Guidelines to preparation and mounting of specimens prior to analysis
40.60
ISO/CD 20579-3 [Under development]
Surface chemical analysis -- Guidelines to sample handling, preparation and mounting -- Part 3: Biomaterials
30.60
ISO/DIS 20579-4 [Under development]
Surface chemical analysis -- Guidelines to sample handling, preparation and mounting -- Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
40.60

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