ISO 16243:2011 Preview
Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
This standard was last reviewed and confirmed in 2017. Therefore this version remains current.
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
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