Abstract Preview

ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.


General information

  • Status :  Published
    Publication date : 2005-08
  • Edition : 1
    Number of pages : 16
  • :
    ISO/TC 201/SC 2
    General procedures
  • 71.040.40
    Chemical analysis

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