Approved Work Item
ISO/AWI 20171
Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electronmicroscopy (TIFF/SEM)
Reference number
ISO/AWI 20171
Edition 1
© ISO 2026
Approved Work Item
Under development
A working group has prepared a draft.

Abstract

This document specifies a platform-independent data file format for digital images generated by a scanning electron microscope (SEM) by adapting the TIFF based format.

General information

  • Status
     : Under development
    Stage
    : New project registered in TC/SC work programme [20.00]
  • Edition
     : 1
  • Technical Committee :
    ISO/TC 202/SC 4
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

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