Standardization in the field of surface chemical analysis. Surface chemical analysis includes analytical techniques in which beams of electrons, ions, neutral atoms or molecules, or photons are incident on the specimen material and scattered or emitted electrons, ions, neutral atoms or molecules, or photons are detected. It also includes techniques in which probes are scanned over the surface and surface-related signals are detected.
Excluded:
Note:
With current techniques of surface chemical analysis, analytical information is obtained for regions close to a surface (generally within 20 nm) and analytical information-versus-depth data are obtained with surface analytical techniques over greater depths.
| Ссылки | Заголовок | Тип |
|---|---|---|
| ISO/TC 201/SC 1 | Terminology | Sub committee |
| ISO/TC 201/SC 2 | General procedures | Sub committee |
| ISO/TC 201/SC 3 | Data management and treatment | Sub committee |
| ISO/TC 201/SC 4 | Depth profiling | Sub committee |
| ISO/TC 201/SC 6 | Secondary ion mass spectrometry | Sub committee |
| ISO/TC 201/SC 7 | Electron spectroscopies | Sub committee |
| ISO/TC 201/SC 8 | Glow discharge spectroscopy | Sub committee |
| ISO/TC 201/SC 9 | Scanning probe microscopy | Sub committee |
| ISO/TC 201/SC 10 | X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis | Sub committee |
| ISO/TC 201/SG 1 | Nano-materials characterization | Working group |
| ISO/TC 201/WG 4 | Surface Characterization of Biomaterials | Working group |
| ISO/TC 201/WG 5 | Optical interface analysis | Working group |
Комитет, указанный ниже, имеет доступ к следующим документам ISO/TC 201:
| Ссылка | Заголовок | ИСО/МЭК |
|---|---|---|
| IEC/TC 113 | Nanotechnology for electrotechnical products and systems | IEC |
| ISO/TC 107 | Metallic and other inorganic coatings | ISO |
| ISO/TC 202 | Microbeam analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
ISO/TC 201 можно получить доступ к документам комитетов ниже
| Ссылка | Заголовок | ИСО/МЭК |
|---|---|---|
| IEC/TC 113 | Nanotechnology for electrotechnical products and systems | IEC |
| ISO/TC 150 | Implants for surgery | ISO |
| ISO/TC 202 | Microbeam analysis | ISO |
| ISO/TC 229 | Nanotechnologies | ISO |
| Дата | Меяц | Местоположение | ТК/ПК | Примечание |
|---|---|---|---|---|
| 15 | October 2019 | つくば市 (Japan) | ISO/TC 201/SC 10 | |
| 31-2 | October-November 2019 | Tsukuba (Japan) | ISO/TC 201 | |
| 2020 | ISO/TC 201/SC 1 | ** |
* Информация определена, но заседание еще официально не проведено
** Предварительное