International Standard
ISO 11505:2025
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Reference number
ISO 11505:2025
Edition 2
2025-06
Read sample
ISO 11505:2025
87870
Published (Edition 2, 2025)

ISO 11505:2025

ISO 11505:2025
87870
Language
Format
CHF 159

Abstract

This document specifies a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

The applicability of this document is limited to description of general procedures for quantification of the chemical composition and thickness in GD-OES compositional depth profiling. This document is not directly applicable for quantification of individual materials having various thicknesses and elements to be determined.

General information

  •  : Published
     : 2025-06
    : International Standard published [60.60]
  •  : 2
     : 34
  • ISO/TC 201/SC 8
    71.040.40 
  • RSS updates

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