Reference number
ISO 11505:2012
ISO 11505:2012
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Edition 1
2012-12
Withdrawn
ISO 11505:2012
50563
Withdrawn (Edition 1, 2012)

Abstract

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

General information

  •  : Withdrawn
     : 2012-12
    : Withdrawal of International Standard [95.99]
  •  : 1
     : 33
  • ISO/TC 201/SC 8
    71.040.40 
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