International Standard
ISO 17297:2025
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Reference number
ISO 17297:2025
Edition 1
2025-05
© ISO 2026
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Published (Edition 1, 2025)

ISO 17297:2025

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Abstract

This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

General information

  • Status
     : Published
    Publication date
     : 2025-05
    Stage
    : International Standard published [60.60]
  • Edition
     : 1
    Number of pages
     : 14
  • Technical Committee :
    ISO/TC 202/SC 1
  • RSS updates

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This standard contributes to the following Sustainable Development Goals

7
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9
Industry, Innovation and Infrastructure

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