Abstract Preview

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

General information

  • Status :  Published
    Publication date : 2015-07
  • Edition : 1
    Number of pages : 20
  • :
    ISO/TC 172/SC 9
    Laser and electro-optical systems
  • 31.020
    Electronic components in general

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