ISO 17862:2013 Preview

Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-of-flight mass analysers

ISO 17862:2014 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. ISO 17862:2014 can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.


General information

  • Status :  Published
    Publication date : 2013-12
  • Edition : 1
    Number of pages : 25
  • :
    ISO/TC 201/SC 6
    Secondary ion mass spectrometry
  • 71.040.40
    Chemical analysis

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