ISO/WD 25797 - Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for determining amount-of-substance of deposited materials and physical film thickness by using X-ray fluorescence spectrometry

Under development

A working group has prepared a draft.

Abstract

This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.

General information

Status
: Under development

Stage
: Close of comment period [20.60]
Edition
: 1
Technical Committee :
ISO/TC 206
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Life cycle

Now

Under development

ISO/WD 25797
Stage: 20.60

This standard contributes to the following Sustainable Development Goals

Decent Work and Economic Growth

Reduced Inequalities

Sustainable Cities and Communities

Responsible Consumption and Production

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