Abstract
This document specifies procedures for the rating and statistical analysis of non-metallic inclusions (referred to as inclusions hereafter) using a scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDS), a backscattered detector (BSD) and automatic image analysis capabilities.
General information
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Status: PublishedPublication date: 2025-09Stage: International Standard published [60.60]
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Edition: 1Number of pages: 19
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Technical Committee :ISO/TC 17/SC 7ICS :77.080.20
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