Abstract Preview

This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale.

This document broadly is applicable to nano-objects as well as to particles with sizes larger than 100 nm. The exact working range of the method depends on the required uncertainty and on the performance of the transmission electron microscope. These elements can be evaluated according to the requirements described in this document.


General information

  • Status :  Published
    Publication date : 2020-06
  • Edition : 1
    Number of pages : 83
  • :
    ISO/TC 229
    Nanotechnologies
  • 07.120
    Nanotechnologies

Buy this standard

Format Language
PDF + ePub
Paper
  • CHF198

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

Keep up to date with ISO

Sign up to our newsletter for the latest news, views and product information.