This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale.
This document broadly is applicable to nano-objects as well as to particles with sizes larger than 100 nm. The exact working range of the method depends on the required uncertainty and on the performance of the transmission electron microscope. These elements can be evaluated according to the requirements described in this document.
Status: PublishedPublication date: 2020-06
Edition: 1Number of pages: 83
Technical Committee: ISO/TC 229 Nanotechnologies
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