Abstract

 Preview

ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.


General information 

  • Status
     :  Published
    Publication date
     : 2015-11
  • Edition
     : 1
    Number of pages
     : 22
  • Technical Committee
     : ISO/TC 201/SC 7 Electron spectroscopies
  • ICS
     :
    71.040.40 Chemical analysis

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal:

9
Industry, Innovation and Infrastructure

Buy this standard

Format Language
PDF + ePub
Paper
  • CHF124

Life cycle


Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

Keep up to date with ISO

Sign up to our newsletter for the latest news, views and product information.

  2. Store
  3. Standards catalogue
  4. ICS
  5. 71
  6. 71.040
  7. 71.040.40
  8. ISO 19830:2015