This standard was last reviewed and confirmed in 2021. Therefore this version remains current.
ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
Status : PublishedPublication date : 2011-12
Edition : 1Number of pages : 2
Technical Committee:Radiographic testing
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