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ISO/TS 10798:2011 Preview
Nanotechnologies -- Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.
The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).
General information
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Current status : PublishedPublication date : 2011-07
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Edition : 1Number of pages : 26
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- ICS :
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Nanotechnologies
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Revisions / Corrigenda
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Now under review
ISO/TS 10798:2011 -
Will be replaced by
ISO/NP TS 10798