ISO/TS 10798:2011 Preview
Nanotechnologies -- Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.
The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).
Buy this standard
A standard is reviewed every 5 years
Revisions / Corrigenda
Now under review
Will be replaced by
ISO/NP TS 10798