ISO 18117:2009 Preview

Surface chemical analysis -- Handling of specimens prior to analysis

ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.


General information

  • Status :  Published
    Publication date : 2009-03
    Corrected version (en) : 2009-06
    Corrected version (fr) : 2009-06
  • Edition : 1
    Number of pages : 9
  • :
    ISO/TC 201/SC 2
    General procedures
  • 71.040.40
    Chemical analysis

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