ISO 21270:2004 Preview
Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
This standard was last reviewed and confirmed in 2016. Therefore this version remains current.
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
Buy this standard
A standard is reviewed every 5 years
Revisions / Corrigenda