This document presents a list of common practices in preparation methods of metallographic specimens for optical and scanning electron microscopy, including preliminary preparation, grinding and polishing of specimens as well as microstructure revelation methods covering the optical method, etching methods (chemical, electrolytic, constant potential, ion sputtering and high temperature relieving) and the interface layer method .
Status: PublishedPublication date: 2022-07
Edition: 1Number of pages: 17
Technical Committee: ISO/TC 17/SC 7 Methods of testing (other than mechanical tests and chemical analysis)
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