Abstract Preview

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

General information

  • Status :  Published
    Publication date : 2014-01
  • Edition : 2
    Number of pages : 10
  • :
    ISO/TC 202/SC 2
    Electron probe microanalysis
  • 71.040.99
    Other standards related to analytical chemistry

Buy this standard

Format Language
PDF + ePub
  • CHF58

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

Keep up to date with ISO

Sign up to our newsletter for the latest news, views and product information.