This standard was last reviewed and confirmed in 2019. Therefore this version remains current.
ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
Status: PublishedPublication date: 2014-01
Edition: 2Number of pages: 10
Technical Committee: ISO/TC 202/SC 2 Electron probe microanalysis
- ICS :
- 71.040.99 Other standards related to analytical chemistry
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Stage: 90.93 (Confirmed)
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