ISO/TS 17915:2013 Preview

Optics and photonics -- Measurement method of semiconductor lasers for sensing

ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.


General information

  • Current status : Published
    Publication date : 2013-07
  • Edition : 1
    Number of pages : 27
  • :
    ISO/TC 172/SC 9
    Laser and electro-optical systems
  • 31.260
    Optoelectronics. Laser equipment

Buy this standard

Format Language
PDF + ePub
Paper
  • CHF138

Got a question?

Check out our FAQs


Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)