Фильтр :
| Стандарт и/или проект находящийся в компетенции ISO/TC 202/SC 2 Секретариата | Этап | ICS |
|---|---|---|
|
Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
|
90.93 | |
|
ISO 14594:2003 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
|
95.99 | |
|
ISO 14594:2003/Cor 1:2009 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy — Technical Corrigendum 1
|
95.99 | |
|
ISO 14594:2014 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
|
95.99 | |
|
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
|
60.60 | |
|
ISO 14595:2003 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
|
95.99 | |
|
ISO 14595:2003/Cor 1:2005 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs) — Technical Corrigendum 1
|
95.99 | |
|
ISO 14595:2014 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
|
95.99 | |
|
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
|
60.60 | |
|
ISO 16592:2006 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
|
95.99 | |
|
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
|
90.93 | |
|
ISO 17470:2004 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
|
95.99 | |
|
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
|
90.92 | |
|
ISO/AWI 17470 [В стадии разработки]
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
|
20.00 |
|
|
Microbeam analysis — Electron probe microanalyser (EPMA) — Guidelines for performing quality assurance procedures
|
90.93 | |
|
ISO 22489:2006 [Отозвано]
Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
|
95.99 | |
|
Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
|
90.93 | |
|
Microbeam analysis — Electron probe microanalysis — Quantitative analysis of Mn dendritic segregation in continuously cast steel product
|
90.20 |
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