Resumen
This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.
Informaciones generales
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Estado: En desarrolloEtapa: Cierre del periodo de observaciones [20.60]
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Edición: 1
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Comité Técnico :ISO/TC 206
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