Filtrar :
| Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 4 Secretaría | Etapa | ICS |
|---|---|---|
|
ISO 16700:2004 [Retirada]
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
|
95.99 | |
|
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
|
90.93 | |
|
ISO/AWI 20171 [En desarrollo]
Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electronmicroscopy (TIFF/SEM)
|
20.00 |
|
|
Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements
|
90.60 | |
|
Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
|
90.93 | |
|
Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
|
90.93 |
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