ISO 24173:2009 Preview

Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.


General information

  • Current status : Published
    Publication date : 2009-09
  • Edition : 1
    Number of pages : 43
  • :
    ISO/TC 202
    Microbeam analysis
  • 71.040.50
    Physicochemical methods of analysis

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