This lecture introduces some basic knowledge of metrological management and related topics. Chapter 2 presents some basic and important contents of metrological management including the dissemination and traceability of the value of quantity, SI, and measurement uncertainty. Chapter 3 contains some basic knowledge of parameter design. This includes three times design and tolerance design. Chapter 4 introduces some important institutions with emphasis on their role and structure. Chapter 5 includes some knowledge of laboratory accreditation and mutual recognition arrangements, and explains ISO/IEC 17025 related to accreditation. Concluding remarks are in Chapter 6.
Preview: http://iliascluster.unibw-hamburg.de/ilias4/goto_konstruktion_pg_44162_49461.html
APLAC, Accreditation, BIPM, CGPM, CIPM, Calibration, EA, ILAC, International standard, Laboratory accreditation, MRA, Metre convention, Metrology, Metrology, Mutual Recognition Arrangement, NIST, OIML, PTB, Reference standard, Traceability, Uncertainty of mMeasurement
| Language(s): | English |
| Authors | Lu, Tongyu, Song, Mingshun , Wu, Hongkuan |
| Publisher: | Wilfried Hesser, www.pro-norm.de |
| First published / Last update: | 2006 / 2010 |
| Courses: | University program level: Master and Bachelor degree; further education material (self studying material) for experts from industry and policy makers China Jiliang University, Hangzhou, PR of China Helmut Schmidt University, Hamburg, Germany Institut Teknologi Bandung, Bandung, Indonesia National Economics University, Hanoi, Vietnam University of Moratuwa Katubedda, Moratuwa, Sri Lanka Inklaar Consultants, Hamburg, Germany |