| Стандарт и/или проект находящийся в компетенции ISO/TC 201/SC 7 Секретариата | Этап | ICS |
|---|---|---|
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
|
90.92 | |
|
ISO/FDIS 10810 [Under development]
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
|
50.00 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
|
90.60 | |
|
ISO/DTR 14187 [Under development]
Surface chemical analysis -- Characterization of nanostructured materials
|
30.99 | |
|
Surface chemical analysis -- Characterization of nanostructured materials
|
90.92 | |
|
ISO 14701:2011 [Withdrawn]
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
|
95.99 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
|
60.60 | |
|
ISO 15470:2004 [Withdrawn]
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
|
95.99 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
|
60.60 | |
|
ISO 15471:2004 [Withdrawn]
Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
|
95.99 | |
|
Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
|
60.60 | |
|
ISO 15472:2001 [Withdrawn]
Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
|
95.99 | |
|
Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
|
90.93 | |
|
ISO 16129:2012 [Withdrawn]
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
|
95.99 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
|
60.60 | |
|
ISO 17973:2002 [Withdrawn]
Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
|
95.99 | |
|
Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
|
60.60 | |
|
Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
|
90.93 | |
|
ISO 18118:2004 [Withdrawn]
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
|
95.99 | |
|
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
|
60.60 | |
|
ISO/DTR 18392 [Under development]
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
|
30.60 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
|
90.92 | |
|
ISO/TR 18394:2006 [Withdrawn]
Surface chemical analysis -- Auger electron spectroscopy -- Derivation of chemical information
|
95.99 | |
|
Surface chemical analysis -- Auger electron spectroscopy -- Derivation of chemical information
|
60.60 | |
|
Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
|
60.60 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction
|
90.20 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Estimating and reporting detection limits for elements in homogeneous materials
|
60.60 | |
|
Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
|
60.60 | |
|
ISO 20903:2006 [Withdrawn]
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
|
95.99 | |
|
ISO 20903:2011 [Withdrawn]
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
|
95.99 | |
|
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
|
60.60 | |
|
Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
|
90.93 | |
|
Surface chemical analysis -- Auger electron spectroscopy -- Repeatability and constancy of intensity scale
|
90.93 | |
|
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale
|
90.93 | |
|
Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
|
90.93 |
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