Borrador del Comité
ISO/CD 18115-4
Surface chemical analysis — Vocabulary — Part 4: Part 4: Terms used in Total Reflection X-ray Fluorescence (TXRF)
Reference number
ISO/CD 18115-4
ISO/CD 18115-4
Edition 1
© ISO 2026
Borrador del Comité
Resumen
This International Standard defines terms for surface chemical analysis. Part four covers the terms related to the technique of total reflection x-ray fluorescence, extending the standard. ISO 18115-1 covers general terms and those used in spectroscopy, ISO 18115-2 terms used in scanning-probe microscopy and 18115-3 focuses on optical interface analysis including ellipsometry, Raman and nonlinear optical techniques.
Informaciones generales
-
Estado: En desarrolloEtapa: Cierre del periodo de observaciones [30.60]
-
Edición: 1
-
Comité Técnico :ISO/TC 201/SC 1
- RSS actualizaciones
