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| Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 3 Secretaría | Etapa | ICS |
|---|---|---|
|
ISO/CD 13139 [En desarrollo]
Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals
|
30.20 |
|
|
ISO/DIS 16887 [En desarrollo]
Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system
|
40.60 | |
|
ISO 19214:2017 [Retirada]
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
|
95.99 | |
|
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
|
60.60 | |
|
ISO 20263:2017 [Retirada]
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
95.99 | |
|
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
60.60 | |
|
Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
|
90.20 | |
|
Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
|
60.60 | |
|
Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
|
60.60 | |
|
ISO 25498:2010 [Retirada]
Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope
|
95.99 | |
|
ISO 25498:2018 [Retirada]
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
|
95.99 | |
|
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
|
60.60 | |
|
ISO/CD 25871 [En desarrollo]
Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction
|
30.20 |
|
|
ISO/CD 26100 [En desarrollo]
Microbeam analysis — Analytical electron microscopy — The thickness measurement of thin foil by electron energy loss spectroscopy
|
30.20 |
|
|
ISO 29301:2010 [Retirada]
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
|
95.99 | |
|
ISO 29301:2017 [Retirada]
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
95.99 | |
|
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
60.60 |
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