Filtrar :
| Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 1 Secretaría | Etapa | ICS |
|---|---|---|
|
Microbeam analysis — Analytical electron microscopy — Vocabulary
|
90.60 | |
|
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
|
60.60 | |
|
ISO 22493:2008 [Retirada]
Microbeam analysis — Scanning electron microscopy — Vocabulary
|
95.99 | |
|
Microbeam analysis — Scanning electron microscopy — Vocabulary
|
90.60 | |
|
ISO/FDIS 23699 [En desarrollo]
Microbeam analysis — Electron backscatter diffraction — Vocabulary
|
50.20 | |
|
ISO 23833:2006 [Retirada]
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
|
95.99 | |
|
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
|
90.60 |
No se ha encontrado ningún registro que coincida. Pruebe a cambiar los ajustes de filtro.