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| Standard and/or project under the direct responsibility of ISO/TC 202/SC 3 Secretariat | Stage | ICS |
|---|---|---|
|
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy |
90.92 | |
|
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy |
30.20 | |
|
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials |
90.60 | |
|
Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis |
60.60 | |
|
Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy |
60.60 | |
|
Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope |
95.99 | |
|
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope |
90.60 | |
|
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures |
95.99 | |
|
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures |
90.92 | |
|
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures |
50.00 |
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