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ISO/TC 202/SC 1  - Terminology

Standards and projects under the direct responsibility of ISO/TC 202/SC 1 Secretariat

Standard and/or project	Stage	ICS
0ISO/FDIS 15932 Microbeam analysis -- Analytical electron microscopy -- Vocabulary	50.00	01.040.37 37.020
1ISO 22493:2008 Microbeam analysis -- Scanning electron microscopy -- Vocabulary	90.60	01.040.37 37.020
2ISO 23833:2013 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary	60.60	01.040.71 71.040.99
3ISO 23833:2006 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary	95.99	01.040.71 71.040.99