
Items to be displayed:
| Subcommittee | Subcommittee Title |
|---|---|
| ISO/TC 202/SC 1 | Terminology |
| ISO/TC 202/SC 2 | Electron probe microanalysis |
| ISO/TC 202/SC 3 | Analytical electron microscopy |
| ISO/TC 202/SC 4 | Scanning electron microscopy (SEM) |
| Standard and/or project | Stage | ICS |
|---|---|---|
| ISO 13067:2011 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size | 60.60 | 71.040.50 |
| ISO 15632:2012 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis | 60.60 | 71.040.99 |
| ISO 22029:2012 Microbeam analysis -- EMSA/MAS standard file format for spectral-data exchange | 60.60 | 71.040.99 |
| ISO 22309:2011 Microbeam analysis -- Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above | 60.60 | 71.040.99 |
| ISO 24173:2009 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction | 60.60 | 71.040.50 |