
Items to be displayed:
| Standard and/or project | Stage | ICS |
|---|---|---|
| ISO 16242:2011 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES) | 60.60 | 71.040.40 |
| ISO 16243:2011 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS) | 60.60 | 71.040.40 |
| ISO/TR 16268:2009 Surface chemical analysis -- Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation | 60.60 | 71.040.40 71.040.30 |
| ISO 18116:2005 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis | 90.93 | 71.040.40 |
| ISO 18117:2009 Surface chemical analysis -- Handling of specimens prior to analysis | 60.60 | 71.040.40 |
| ISO 18516:2006 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution | 90.92 | 71.040.40 |
| ISO/TR 19319:2013 Surface chemical analysis -- Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods | 60.60 | 71.040.40 |